| The design of solid-state light source systems mainly focuses on reshaping and measuring the spatial distribution of irradiance for different application needs.In the field of hyperspectral and solar simulators,uniform illumination based on solid-state light source systems provides a basic guarantee for the research of thermochemical processes,biomedical systems,and photovoltaic devices.In fields such as optical communication,testing the spatial distribution of irradiance of a solid-state light source system can more directly reflect its intrinsic characteristics,which is of great significance to the design and development of optical systems.Therefore,research on irradiance reshaping and characterization of solid-state light source systems can provide a basic guarantee for improving the test efficiency of illumination uniformity and irradiance spatial distribution.The purpose of this research can be divided into two:design and development of irradiance uniformity shaping and radiation pattern measurement system based on a solid-state light source.To achieve these goals,the irradiance uniformity shaping design of the solid-state light source based on the spatial filter film and the measurement of the radiation pattern of the solid-state light source in the plane coordinate system will be carried out in sequence.1)Irradiance uniformity reshapingTo correct and improve the spatial distribution of irradiance after a solid-state light source system is configured,a spatial filter reshaping scheme is proposed based on computer-generated patterns that are transferred onto flexible films.Theoretically,it relies on the physical phenomenon of a positively correlated relationship between inkjet concentration and film transparency,which is subsequently verified experimentally and polynomially fitted to establish the characteristic equation between absorbance and grayscale values.Furthermore,by utilizing the light intensity distribution to be calibrated,matrix operations,and bilinear interpolation,a computer-aided pattern generation algorithm is proposed to construct the spatial filter films.Experimentally,to obtain an accurate irradiance distribution,a parallel line scans direct measurement system based on the STM32 data acquisition board and host PC has been constructed.In addition,three LED based solid-state light source systems are selected to validate the proposed scheme,including: a single lamp,a 5×5 array,as well as a specially designed 5×5 array located on a curved surface.The results reveal that the corrected irradiance uniformity improves by 15.5%,24.01%,and 13.11%,all of which achieve the Class A irradiance uniformity of the IEC 60904-9 standard.As a result,the solution is flexible enough to post-correct the irradiance uniformity inherent in solid-state light source lighting systems.2)Radiation pattern measurementsBased on planar-positioned detector array with deflection angles,this paper presents a non or less rotation method for parallel obtaining large view-angle solid-state light source radiation patterns.The method theoretically relies on the cosine negative quadratic relationship,on which two layouts are proposed.The first rotation-free polar layout can provide results compatible with traditional goniometers for narrow-view sources.The experiments on 1D systems demonstrate the two have good consistency with the normalized square root errors ranging from 0.56% to 0.68%.Furthermore,a73-channel parallel system is constructed for 3D wireframe radiation patterns.Particularly,the second Cartesian layout is proposed based on the spherical polyhedron segmentation,and a 144-channel less-rotation system is constructed for large viewangle patterns with uncertainty ranging from 0.40% to 0.43%.Therefore,the method can be employed to construct solid-state light source radiation pattern measurement systems with attributes of parallel,large view-angle,and rotation-free or less-rotation. |
PDF Full Text Request