Development And Research Of Gigabit Ethernet Chip Test System Based On UltraFlex Platform

With the rapid development of integrated circuit design level and process technology,mixedsignal integrated circuits that combine digital and analog functions have become more and more popular in the semiconductor industry.Integrated circuit testing plays an important part in integrated circuit design verification and batch production.Its economy and importance have become increa Singly prominent.Integrated circuit testing technology has developed with the rapid development of integrated circuits,and has made great contributions to the advancement and wide application of integrated circuits.In response to the test requirements of the company's 88E1111 Gigabit Ethernet chip design,the author completed the chip test hardware interface circuit design,test program development,test verification and test result analysis Based on the automated test equipment Ultra Flex test platform.The main content includes:1.Complete the optimization design of the overall plan for the electrical performance parameter test of the chip on the basis of detailed analysis of the circuit structure and functional characteristics of the 88E1111 Gigabit Ethernet chip,which consists of the customization of the test fixture,the hardware interface of the test load board,and the principle of the peripheral circuit Figure(Cadence allegro software)and PCB layout(PCB edit software)design.The test results show that the Ultra Flex test platform can be connected to 117 channels of test load boards,test fixtures,and chips.2.Complete chip test program development Based on IG-XL software,including function test,DC parameter test and AC parameter test Based on detailed analysis of 88E1111 Gigabit Ethernet chip function and electrical characteristic parameter test principle and test method.The functional tests include: 100 Base data transceiver function,10 Base auto-negotiation function,MDC/MDIO register read and write function,high-speed Ser Ders function test.DC parameter test includes: connectivity test,short circuit test between pins,input and output pin leakage current test,Static power consumption and dynamic power consumption test,input and output high and low voltage test,etc.AC parameter test includes: data signal establishment and hold time,clock signal high and low pulse width,output signal rise and fall time,etc.The test results show that the test program can test the four main functions of the chip,with a maximum frequency of 1.25 GHz;it can also test 15 DC parameters and 92 AC parameters,and the test values all meet the index requirements.3.Based on the detailed analysis of the IG-XL software VB underlying code frame structure and the realization of the test mechanism,the debugging,verification and result analysis of the function and electrical characteristic parameter test after combining the 88E1111 Gigabit Ethernet chip and the Ultra Flex test platform are completed.Use the debug tool(pattern tool and waveform display)of the IG-XL software and the auxiliary equipment oscilloscope to capture the waveform to debug the functional test vector,and use the underlying code to develop the test technology(eye diagram test method,jitter test method,match loop test method,high-speed serdes signal test method)to verify,compare the test value with the index parameter.The test results show that these test methods can be used to test the chip's function and electrical characteristics,and it is more accurate and efficient than traditional test methods.Based on the research above,5 pieces of 88E1111 Gigabit Ethernet chip samples are used to test the paper design system.The test results show that the test coverage rate of the entire test system reaches more than 90%,and the test pass rate is 100%.