Research On Reliability Modeling And Evaluation Method Of Superluminescent Diode Based On Degradation Of Optical Power Performance

Superluminescent diode is a kind of semiconductor optical device with long life and high reliability widely used in aerospace,medical,radio and other fields.Therefore,research on its reliability is of great significance.The traditional reliability analysis method based on the working failure life is not suitable for long-life and high-reliability devices.After analyzing the failure mechanism of superluminescent diodes,this article found that its optical power performance contains a lot of information during the degradation process.Therefore,it is feasible and effective to use the performance degradation to model the reliability of the superluminescent diode and complete the reliability evaluation.This article mainly contains the following contents:(1)The working principle and characteristics of superluminescent diodes are described,and its failure modes and failure mechanisms are deeply analyzed.The reliability theory of performance degradation is described and analyzed,and reliability performance indicators are proposed.(2)The reliability analysis model of superluminescent diode based on time series is established.Aiming at the time-series characteristics of the performance degradation of superluminescent diodes during operation,a time-series model is proposed to fit the performance degradation.The two-parameter smoothing method is a time series with a long-term trend but no seasonal trend,and a linear trend at the same time,which is very suitable for fitting the performance degradation of superluminescent diodes.According to the set failure threshold,the pseudo-failure life of the superluminescent diode is obtained.Calculate the reliability model parameters through the pseudo-failure life data,and then complete the analysis and evaluation of its reliability.(3)Establish a reliability model of superluminescent diode based on graphic method.Aiming at the problem that using time series to fit superluminescent diodes may lead to ideal evaluation results,a power exponential function is used to fit the degradation trend,and the performance degradation trajectory fitting equation is obtained and graphed.A data quality inspection tool(individual distribution identification)is proposed to detect the reliability model of the false failure life.Considering that the false failure life may not conform to the normal distribution,the data is transformed by BOX-COX to obtain the log-normal Distribution.The comparison shows that the use of lognormal distribution for the reliability analysis of superluminescent diodes has the best effect.Finally,an example is used to verify that the method is effective.