Wide Field Imaging System Based On NV Color Center

Nitrogen vacancy color center is a kind of lattice defect widely existing in nitrogen-containing diamond.At room temperature,NV color center has excellent optical properties,long spin life,ability to initialize and read optical spin states,coherent microwave spin manipulation and other advantages.Therefore,NV color center is widely used in the field of microwave magnetic field precision measurement.Imaging representation can achieve the acquisition of spatial field distribution information,and is the reconstruction of target information of the object to be measured.Different from the serial point by point scanning measurement methods such as miniature magnetic field probe and Superconducting Quantum Interference Device(SQUID),parallel wide field imaging can quickly obtain the field information of large area targets.Based on the above background,this paper mainly conducts research on wide field imaging technology based on NV color center:1.Based on the technology of quantum diamond microscope,a wide field of view and fast microwave field imaging system is successfully built by using the diamond film sample containing a large number of NV color center and combining confocal technology with micro imaging technology.2.The multi-channel pulse generator is used to ensure the synchronous operation of laser pulse,microwave switch pulse,microwave source and CMOS camera;the real-time acquisition of differential image frame is realized through software programming,and the method of averaging multi images of repeated measurements is adopted to reduce the measurement noise,improve the imaging quality and enhance the detection sensitivity of the system.The system noise is analyzed,including photon shot noise,dark current noise and readout noise.Finally,the feasibility of the system is verified by pulse ODMR measurement experiment and Rabi oscillation measurement experiment.3.The parameters of the imaging system are evaluated.According to the experimental data,the detection sensitivity of the system can reach 2uT/(Hz)^1/2;the spatial resolution is 1.5?m;the spatial resolution can reach 400 nm by using the large numerical aperture objective;the imaging efficiency is high,and a complete wide field imaging test only needs 900 ms.Finally,the fast imaging of microwave field on the surface of some areas of the transistor amplifier is realized,and the good magnetic imaging ability of the system is verified.In this paper,a wide field of view fast imaging technology based on Diamond NV color center is proposed,which has the advantages of high spatial resolution,wide imaging range and fast real-time imaging.It is expected to provide a new technology for microwave RF chip rapid nondestructive testing.