Development Of Performance Test Platform For Wide Spectral And Multi-band Photoelectric Detector

With the development of photoelectric technology,photoelectric detector has become one of the important basic components in various industries.Photoelectric detector will be measured signal into electrical signal,the amplifier can be used to characterize the size of the signal to be measured.In the measurement of weak optical signal,external noise interference and uncertain factors will affect the test results,so the reliability and accuracy of the photoelectric detection system is a necessary condition to ensure the normal work of the photoelectric detector.Due to the extremely wide spectral range covered by the photodetector,From 200nm ultraviolet detectors to 14 micron long-wave infrared detectors,each has its own purpose,and the commercially available photodetector test equipment usually only targets a certain spectral band:UV-visible light detector test system,visible light short-wave infrared detector test system,medium wave infrared long-wave infrared detector test system,a single test platform is difficult to completely cover the entire spectral band.To meet wide spectrum,multichannel photodetector technology research,this paper designed and established a set covers the whole spectrum of photoelectric detector testing platform,on the same platform to achieve the sun-blind ultraviolet-visible-short wave infrared,medium wave infrared-long wave infrared detector technology parameters test.The main work is as follows:According to the performance test requirements of the wide spectrum and multi-band photodetector parts,the overall scheme of the test platform for the wide spectrum and multi-band photodetector parts is designed,and the source of the interference signals of each performance parameter in the test process is analyzed,and the corresponding technical scheme is designed for these interference signals.On the basis of the overall scheme design,this paper will be black body furnace,light-emitting diode,long-wave infrared laser and various optical modules,test instrument integration,through the optical path design,to achieve the full coverage of solar blind ultraviolet to long-wave infrared,to meet the test needs of the development of wide spectrum multi-band photodetector technology;And through the electromagnetic shielding layer,reliable grounding techniques such as the adoption of maximum suppress the interference signals,the influence of the result of the test to ensure the accuracy of measured data,and through the integration of and temperature control platform,realizes the device effective control of the environment temperature from 77 k to room temperature,meet the device performance with temperature change rule of testing needs.At present,the platform can achieve the accuracy of 1.5%device current 100fA?20mA measurement,and for the time response,the fastest sampling rate of the platform is 10?s,the maximum storage of 100000 sampling points.Based on the test platform construction,this paper completed the lab has developed wide spectrum of multichannel photodetector performance tests,covers the blind ultraviolet detector,optical detector,short wave infrared detector,long wave infrared detector,and with the corresponding band goods detector compares the performance of the test result,The accuracy of the test results of the test platform is confirmed,which indicates that the performance platform of the wide spectrum and multi-band photodetector parts conforms to the technical requirements of the performance test of the photodetector parts.