Design And Implementation Of Process Adjustable I-V Test System Based On Photoelectric Sensors

Photoelectric sensor is a device that can convert light radiation into electrical signals,and it plays an irreplaceable important role in many fields of modern production and life.The development of micro-nano manufacturing technology has enabled photoelectric sensor to gradually develop in the direction of miniaturization and low power consumption;on the other hand,photoelectric sensor based on materials such as graphene,perovskites and III-V compounds have emerged.I-V test is one of the most widely used methods of photoelectric sensor performance characterization.With the development of photoelectric sensors,higher requirements are put forward for photoelectric sensor I-V test.As is sated above,this article combined with LabVIEW to design a process adjustable I-V test system based on photoelectric sensors,using wavelet threshold noise reduction method to reduce the impact of noise on useful signals.It can test the I-V characteristic curve of photoelectric sensor from picoamps to milliamps,and can realize the remote control of the test process.A process adjustable I-V test system based on photoelectric sensor is designed and developed in this paper.The system hardware mainly includes a data generation module,a data acquisition module and data processing and remote control module.The system which adopts process oriented and component-oriented hybrid programming method based on LabVIEW achieves functions of collection,processing,display,storage and reading through the data collected in real time from human machine interface.We compared the response time and stability of remote control methods such as intranet mapping,and finally use cloud server and Web to realize the remote monitoring function,.The test control program can be accessed through the browser in the wide area network for remote control.The wavelet threshold denoising method is designed with MATLAB to process data due to the weak current is easily affected by external noise.The simulation results show that the SNR can be improved effectively without distortion.In this paper,I-V curve of resistance and dark I-V curve of photoelectric sensor were tested to verify the functions of this system.Compared with theoretical values,the measured values of stability and reliability were verified.The practicability of the system was verified by measuring the photocurrent-voltage curve of the photoelectric sensor.Finally,the I-V curves of photoelectric sensor whose output current signals are nanoampere and microampere were tested.The signal to noise ratio was increased by 31% using wavelet threshold denoising,which indicates that the test system has an excellent noise processing ability under weak current conditions.After testing a variety of devices and photoelectric sensors,it shows that the system has the characteristics of process adjustable,wide range,good stability and high precision.It is suitable for the I-V test of multifarious photoelectric sensor,and provides a reliable and universal design scheme for the detect of other components with weak output current,and provides a reference for the realization of remote control functions in other test work,which has important application value.