Research On Measurement And Calibration System Of Spectral Responsivity Of CCD Camera

As the CCD camera has the characteristics of high sensitivity,small distortion,low noise,etc.,its application field is becoming increasingly widespread.The spectral response curve is one of the important technical parameters of the CCD camera,and is also an important reference for device selection,application system design,and performance evaluation.Therefore,it is very important to accurately measure the spectral response curve of a CCD camera.In order to solve the problems of low detection accuracy and complicated detection methods for spectral response curves of CCD cameras,a set of accurate and relatively simple CCD spectral calibration system was proposed.This paper designs and implements a CCD camera spectral calibration system covering 400 nm to 1100 nm.The principle of relative spectral response measurement of CCD camera was analyzed.A wide-spectrum,high-sensitivity silicon photodetector with calibrated response was used as the reference detector.Based on the single optical path standard replacement method,a relative spectral response test system for CCD camera was built.The system can complete the relative spectral response measurement of CCD devices in the band from 400 nm to 1100 nm.The relative spectral response curve of this camera was measured using Sevonic’s 10-bit black-and-white CCD camera MVC1000M-10 bit.The peak wavelength was 580.3nm,the center wavelength was 624.6nm,and the spectral bandwidth was 447.7nm.The uncertainty analysis results of the system show that the maximum uncertainty of the relative spectral response of the CCD device is 1.04%,which is 42.2% higher than that of the traditional standard alternative method,which satisfies the spectral response of the CCD camera.Test accuracy requirements.The system has the characteristics of good measurement repeatability,high system sensitivity,simple measurement system operation,low cost,etc.It can also meet application requirements,and can provide key data support for CCD image sensor selection,parameter performance evaluation,and subsequent machine test.