Research On Reliability Test System Of Probe Circuit

The directional exploration tube circuit is an important component of the real-time feedback of the hole state in the logging while drilling system,and its reliability research is of great significance.This thesis takes the probe circuit as the research object,analyzes the theoretical basis of the reliability test of the probe circuit and establishes the relevant model,designs and implements an automatic detection system for the probe circuit for the reliability test,and improves the probe tube system.The efficiency of HALT and HASS tests during circuit design and production improves the reliability of the probe circuit.details as follows:First,based on the introduction of the reliability theory of electronic products,this thesis analyzes the failure rate curve of the probe circuit,and establishes the probe circuit system model and the strength-stress of the probe for reliability test analysis based on the characteristics of the probe circuit The interference model analyzes the impact of the HALT & HASS test on the reliability of the probe circuit and the physical principles involved in the probe circuit test process.Secondly,in order to improve the test efficiency of the probe circuit,this thesis analyzes the functions that need to be tested during the test of the probe circuit,and designs and manufactures an automatic test system for the probe circuit.The overall design of the test system is carried out through requirements analysis and main technical indicators,and modular design is adopted on the hardware.The parameter measurement and signal simulation module,circuit communication module,program-controlled power module,and overall structure are designed and implemented.Realize the scheme presetting and automatic test of the probe function,automatic storage of test results and condition query,and necessary interaction of system software.Finally,this thesis analyzes the temperature and vibration stress of the probe circuit in the working environment,and conducts finite element simulation of the circuit under the vibration stress,and then uses the automatic test system of the probe circuit and the test environment box to perform the HALT & HASS test on the probe circuit.The tests show that the test system can find defects in the design and production of the probe circuit in time,which improves the test efficiency and saves test resources,and the system meets the industrial test requirements.