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Ab initio determination of kinetics for atomic layer deposition modeling

Posted on:2015-12-14Degree:M.SType:Thesis
University:University of Maryland, College ParkCandidate:Remmers, Elizabeth MFull Text:PDF
GTID:2471390020450929Subject:Engineering
Abstract/Summary:PDF Full Text Request
A first principles model is developed to describe the kinetics of atomic layer deposition (ALD) systems. This model requires no fitting parameters, as it is based on the reaction pathways, structures, and energetics obtained from quantum-chemical studies. Using transition state theory and partition functions from statistical mechanics, equilibrium constants and reaction rates can be calculated. Several tools were created in Python to aid in the calculation of these quantities, and this procedure was applied to two systems- zinc oxide deposition from diethyl zinc (DEZ) and water, and alumina deposition from trimethyl aluminum (TMA) and water. A Gauss-Jordan factorization is used to decompose the system dynamics, and the resulting systems of equations are solved numerically to obtain the temporal concentration profiles of these two deposition systems.
Keywords/Search Tags:Deposition, Systems
PDF Full Text Request
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