| There is growing presence of Threshold Logic Gate in various VLSI implementations owing to its reduced complexity, maneuverable at high frequencies and minimized wiring. Work has been done in the field of synthesizing Threshold Logic Gates with emphasis on designing them. In threshold logic circuits with RTD-HFETs are principal elements. The characteristics of RTD-HFET greatly depend on the parameters of RTD. But there is great chance of changes in parameters of RTD due to manufacturing defects, operational conditions. Therefore there is need of considering parametric variations. We tried to propose a new methodology of designing Threshold Logic gates which tries to improve the robustness of the threshold gates. |
