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A Study of EMI-TFSI Using Current Sensing Atomic Force Microscop

Posted on:2019-02-10Degree:M.SType:Thesis
University:University of Missouri - Kansas CityCandidate:Lee, Jonathan MarrielFull Text:PDF
GTID:2442390005971953Subject:Materials science
Abstract/Summary:PDF Full Text Request
A current sensing atomic force miscroscope was employed to find simultaneous force-distance and current-distance curves for the ionic liquid EMI TFSI on HOPG. These current curves, found at various voltage biases were converted to find conductance- distance curves. The conductance curves were analyzed to see the cantilever, HOPG surface and ions in EMI TFSI act with a capacitor like behavior. Calculations for the capacitance and energy stored are included. Derivations for the jump off force for a tip, sample system in a liquid enviornment with potential difference have been performed. These formulas for the jump off forces have been evaluated and compared with the experimental jump off forces.
Keywords/Search Tags:Force, Current, Curves
PDF Full Text Request
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