Font Size: a A A

EBAPS Electron Bombardment Performance Test Technology Research

Posted on:2020-10-15Degree:MasterType:Thesis
Country:ChinaCandidate:X D TangFull Text:PDF
GTID:2438330626453167Subject:Optical Engineering
Abstract/Summary:PDF Full Text Request
As a new type of hybrid photodetector,EBAPS has been widely used in night vision technology,laser radar,high energy physics and astronomical observation.It not only has the advantages of high gain,fast response speed and flexible spectrum of vacuum photodetectors,but also has the advantages of high spatial resolution,low power consumption,low cost and mature technology of semiconductor detectors.Since the electron bombardment performance of EBAPS determines the detection performance of EBAPS components,studying the electron bombardment performance of EBAPS is one of the key technologies to guarantee and improve the performance of EBAPS.Based on the characteristics of EBAPS,this paper studies the test method and test system of electron bombardment APS,aiming to provide theoretical basis and experimental guidance for the development of high performance EBAPS.Firstly,this paper introduces the development history and research status of EBAPS.Secondly,it analyzes the working principle of EBAPS in detail,and focuses on the electron bombardment gain mechanism of EBAPS.Based on the vacuum and solid device performance parameter test methods,the test principles and methods of various electronic bombardment APS performance parameters are proposed,including the gain,signal-to-noise ratio,dynamic range and defect detection of electron bombardment APS.Thirdly,an FPGA-based APS signal readout and USB transmission system under vacuum environment was developed,according to the characteristics and test requirements of GSENSE400 BSI APS.Mainly including system hardware design,FPGA logic design and USB firmware programming.Fourthly,the electronic bombardment APS test vacuum component was developed to provide test conditions for the electronic bombardment APS performance parameter test,including the design of testing special vacuum cavity,large area uniform controllable electron source,high voltage power supply,micro ammeter and auxiliary structure.Fifthly,the MFC-based test software is completed.It realizes real-time display of electronic bombardment APS image and calculation of performance parameters.Finally,an electronic APS bombardment experiment was carried out.The results show that the test system can not only obtain the electron impact APS image,but also test the electronic bombardment performance parameters of APS under the specified conditions,which provides conditions for obtaining high quality EBAPS components.
Keywords/Search Tags:EBAPS, Electron bombardment performance, FPGA, USB, Vacuum component
PDF Full Text Request
Related items