Design And Implementation Of IGBT Aging Data Acquisition And Processing System Based On Labview

In recent days,The insulated gate bipolar transistor(IGBT)due to superior performance,are widely used in the field of electric vehicles,new energy power generation,industrial heating and household appliances frequency conversion,etc.However,IGBT often work under the condition of high voltage,large current and high frequency,power volatile,IGBT to withstand high imbalance thermal stress.Thereby producing a bonding wire or solder layer off fatigue,and ultimately lead to device aging failure.In order to improve its reliability,often to study the relationship between aging and its parameters.Traditional aging parameters measuring method has the shortcoming with a measurement accuracy is not high,slow measurement and no automatic calculation function.To solve these problems,this paper using the LabVIEW software,aims to research and design a virtual device of IGBT aging parameters acquisition and processing.The device is capable of acquiring multiplexed data,and use these data to calculate aging parameters needed quickly.This paper first discusses the research of IGBT aging mechanism both here and abroad,obtaining that parameter measurement is the critical work to the study of aging.Then investigated the research status of domestic and commercial usage parameter measurement system,through research,most of the equipment is expensive.and introduces the principle of their calculation.Subsequently,the paper describes in detail the design and the overall design of the structure and design methods for each part of the whole system.Finally,we set up experimental circuit,and measured the IGBT gate capacitance and parasitic inductance with the system.By repeatedly measuring,verify the stability of the system.The paper also measured the parameters with aging IGBT module and healthy one under the same test condition,qualitatively draw trends of IGBT parameters during aging process.