Research On The Optimization Of Multiple Types Fault Test Pattern Set For Integrated Circuits

With the rapid development of the information,integrated circuits have been widely used in civil,commercial,military and other fields.At the same time,integrated circuit testing has become more and more important as one of the important links to ensure the quality of integrated circuit.The continuous increase in the demand for integrated circuits and their processes,and the increasing circuit scale and design complexity,not only make it more difficult to generate integrated circuit fault test pattern sets,but also cause the increasing scale of the integrated circuit fault test pattern sets.The generated integrated circuit fault test pattern set often contains a large number of redundant test patterns,which causes an increase in integrated circuit test time and increases the cost of integrated circuit testing.Therefore,the optimization of the integrated circuit fault test pattern set has gradually attracted attention from scholars at home and abroad.In this paper,after studying in depth various existing test pattern set optimization algorithms and analyzing the advantages and disadvantages of these algorithms,a test pattern set optimization method based on the minimal set covering method is proposed.This method remodels by establishing the correspondence between the fault set and each test pattern in the test pattern set,and transforms the test pattern set optimization problem into a minimal set covering problem to solve.According to the existing solving method of the minimal set covering problem,this method uses a heuristic solution method that is more suitable for large-scale problem than the precise solution method.Based on the test pattern set generated by the automatic test pattern generation tool TetraMAX ATPG,this method achieves an effective reduction of the size of the test pattern set and explains its feasibility through experiments.In addition,on the basis of further research on the multiple faults test pattern set optimization method,this paper presents a multiple faults test pattern set optimization method combining a fusion matrix.The concept of fusion matrix is ??proposed.For the multiple faults model and initial test pattern set,it is first transformed into multiple single fault-test pattern matrices,and then integrated by vertical superposition to obtain a fusion matrix.Subsequently,the optimal solution of the test pattern set under multiplefaults can be obtained by combining the minimal set covering solution method.This method ensures that the solution obtained by the minimal set covering solution method on the fusion matrix is the optimal solution.On the basis of ensuring that the test pattern set has constant coverage for multiple faults,this method effectively reduces the scale of the test pattern set.Provides better quality test pattern set for subsequent fault diagnosis process.