Test Technology Of Polarized QWIP Study

In recent years,the development of polarization of the quantum well infrared photodetector with high sensitivity,good uniformity and material growth and device processing technology is mature,moderate cost for equipment size,easy to color and the large area array devices monolithic integration process easy to get the advantages of infrared polarization sensitive characteristics,can significantly enhance the detection system of camouflage,dim target and background difference,significantly improve the target detection and recognition ability.Detector is the core device of the infrared imaging system,so the accuracy of the test performance and polarization characteristics of polarization detector is improve the important basis of polarization IR imaging system performance.This paper briefly introduces the history of development of infrared detector and infrared polarization imaging at home and abroad,based on the analysis of the infrared polarization imaging principle and polarization of quantum well infrared detectors on the principle of 640x512LW for large array polarized quantum well infrared detector selection and design scheme of polarization;infrared focal plane testing technology based on the proposed and studied the polarization characterization of quantum well infrared detector performance parameters and test methods;according to the technical requirements of the readout circuit of polarization quantum well infrared focal plane detector and polarization characteristics of a test precision test system,test system design and the accuracy of testing experiment;design experiment scheme,based on the MATLAB platform,to the main performance parameters are analyzed and studied.