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Design Of IGBT Module Health Monitoring System

Posted on:2020-06-23Degree:MasterType:Thesis
Country:ChinaCandidate:W N LeiFull Text:PDF
GTID:2428330596479250Subject:Microelectronics and Solid State Electronics
Abstract/Summary:PDF Full Text Request
Insulated Gate Bipolar Transistor(IGBT)has been widely used in renewable energy generation,automotive electronics,aerospace,locomotive traction and many other fields due to its good comprehensive performance and strong vitality.As a core component in power electronic system,power modules are critical to the long-term safe and reliable operation of the entire system.Therefore,there is an urgent need to find an effective method for condition monitoring,fault diagnosis and safety assessment of a module,so as to realize the reliability evaluation and lifetime prediction of the module,and improve the automation level of the operation and management of the power electronic system.In this paper,the IGBT module health monitoring system is designed based on the IGBT module failure mechanism.The IGBT module parameters acquisition,junction temperature prediction and lifetime prediction are mainly studied.Firstly,the basic structure,working principle,failure mechanism and lifetime prediction model of the IGBT are expounded and analyzed,and the monitoring methods and technology under various failure modes are summarized and compared.Secondly,because the junction temperature of the IGBT module is difficult to directly measure accurately,the online junction temperature prediction method of dVCE(sat)IcE is adopted,The feasibility of the method is verified by simulation and experiment,and the module life prediction model based on junction temperature is analyzed in detail.Otherwise,A health status monitoring system is designed for the module parameter monitoring method.The hardware circuit design of the acquisition module and the storage module and its application program design are described in detail.Finally,on the basis of the normal operation of the overall the health status monitoring system.The saturation voltage drop,collector current and temperature collected by the system are used to predict the junction temperature and lifetime of the IGBT module.The data processing and application are realized through the monitoring system designed by the Matlab GUI graphical user interface.In this paper,the state parameters of the IGBT module are analyzed,and the relationship between the parameters and the junction temperature is obtained.The state parameter data collected by the health monitoring system is used to predict the junction temperature and lifetime.This provides a theoretical basis for the health monitoring and safety assessment of IGBT modules,and has reference significance for IGBT reliability research.
Keywords/Search Tags:IGBT module, Monitoring System, Junction temperature prediction, lifetime prediction
PDF Full Text Request
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