RRAM-Based PUF Reliability Test And The System Construction

In order to protect the hardware safety,physical unclonable function are considered to be one of the promising security solution.The advantage of the RRAM-based PUF is that it not only makes use of the variation in the manufacturing process,but also exploits the inherent randomness of the unique conductive mechanism.Therefore,RRAM is a better random source than other devices,and RRAM-based PUF also has its own unique advantages.This thesis mainly completed the testing of a RRAM-based PUF chip and the construction of the chip test system.We built a test system based on the Xilinx Zynq-7000 SoC ZC706 and used C to improve the flexibility and controllability.In order to solve the bias problem,we have written different key extraction algorithms to optimize the two modes,and use the distribution of continuous/split resistance to improve the randomness/reliability of the key.After our optimization,the Inter-HD of the two modes are close to the ideal value of 50%,and the uniformity is also close to 50%,which indicates that the output key has ideal randomness.And we realized the reconfigurable key by the stochastic formation of the conductive filament and passed the NIST test.In terms of reliability,the main test chip retention capabilities to against read disturb,temperature variation,retention and power variation.Among them,the differential mode exhibits superior reliability during the read disturb and temperature variation.It can achieve 10 billion readings without errors.While,the median mode has more errors.We baking the chip under 125? for 100h,the differential mode has a stronger retention ability that can work 60h without error.And the Intra-HD only elevates to 0.78%.However,median mode has shower error only after 2h and then lose efficiency completely.Two kind of modes have showed high reliability(intra-HD is 0%)during the variation of power voltage.