Super Resolution Methods And Technology Based On Digital Engineering Lighting

With the development of science and technology,the importance of objects'detail information becomes increasingly prominent.Compared to electron microscope,optical microscope has the characteristics of non-contact,nondestructive and detectable samples' internal information which makes optical microscope popular in life science research.However,the existence of diffraction limit limits the resolution.In the unremitting efforts of researchers,many super-resolution optical microscopy imaging methods are realized,including stimulated emission depletion(STED),structure illumination microscopy(SIM),photoactivated localization microscopy(PALM)and stochastic optical reconstruction microscopy(STORM).Compared to other methods of super-resolution microscopy,SIM is suitable for a variety of fluorescently labeled samples and has better time resolution without the need for a strong light source.These features make SIM have a big advantage in the real-time observation of the sample.Based on Digital Micromirror Device(DMD),I designed a structured illumination super-resolution fluorescence microscopy,and verified the super-resolution restoration algorithm of linear SIM and blind SIM.The experimental results verify the effectiveness of the optical path and the algorithm.The main results of the work and achievements include:1.1 studied on super-resolution imaging principle of SIM,writed the appropriate simulation programs,simulated,and compared recovery images with the wide field images to illustrate the effect of super-resolution.2.1 designed and build the optical system including structured light generating optical path and imaging optical path,and provided a detailed theoretical analysis and an actual light path display.3.1 proposed a new algorithm for super-resolution restoration of fluorescence imaging,which combines random pattern illumination,pattern estimation algorithm and Fourier Ptychography(FP).This method,termed as Pattern-Estimation Fourier ptychography(PEFP)microscopy,does not need to control the shape of speckle illumination.Compared with pattern-illuminated Fourier ptychography(piFP)algorithm,our method does't need to know the prior information about the speckle scanning position,so it is insensitive to rotation error and displacement error.To further prove the effectiveness of this method,we compared this algorithm with the PE-SIMS-PR algorithm,and found that out method shows better resolution enhancement both in our simulations and experiments.In addition,our approach also has advantages in aberration correction due to the introduction of aberration correction into the PEFP algorithm.