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Research On Limit Detection Conditions Of Integrated Circuits For Space Use Based On PIND

Posted on:2019-11-21Degree:MasterType:Thesis
Country:ChinaCandidate:Q Z SongFull Text:PDF
GTID:2382330548494076Subject:Mechanical engineering
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As a result of the extreme working environment,complex stresses and a smaller size,the detection of aerospace integrated circuits becomes more difficult.A common practice,which is to broaden the experiment conditions,is generally used to reduce error in the PIND test before the circuits are delivered.However,with a variety of different enhancements,some fatigue damage,even invalidation might occur due to the lack of guide documents and professional standards.This article raises the experiment efficiency by modifying test means with a sample aerospace integrated circuit.A potential structure defection is analyzed in the PIND test through relevant researches to improve the reliability.This work is given as follows.Firstly,a literature review of the principle and mechanism of the particle impact noise detection test based on vibration characteristics lays the foundation.Further detection of the integrated circuits are analyzed to locate the possible incentive redundancy.Secondly,an improvement of the PIND test is applied with a more advanced oscilloscope to achieve a more accurate and faster identification to the redundancy inside the integrated circuits.The summary of wave comparison under different test conditions is raised to find out the main factors affecting the test conditions on the wave form.By orthogonal experiment,the main influencing factors of the improved test are verified.Thirdly,in the experimental part,simulated analysis and modelling are conducted using ANSYS software under the condition of the limit tests to compare the images of the distribution of stress and strain in different circumstances.By these methods,the deformation and stress fatigue are possibly identified.This paper provides important reference data to the optimization design of aerospace integrated circuits.
Keywords/Search Tags:Integrated circuit, PIND, Vibration, Finite element analysis
PDF Full Text Request
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