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Research On State-of-health Extraction Method Of High Power IGBT Modules And Design Of The Accelarated Aging Test Platform System

Posted on:2019-02-05Degree:MasterType:Thesis
Country:ChinaCandidate:W ShiFull Text:PDF
GTID:2348330542492818Subject:Electrical engineering
Abstract/Summary:PDF Full Text Request
In the recent years,the high volume power conversion system has been playing a key role in the development of the electric vehicle,the offshore wind power,industrial drive and FACTS.However,as applicable systems tend to be of higher voltage and higher power volume,the power conversion equipment especially the high power IGBT module is restricting the improvement of reliability.Therefore,state-of-health online extraction of IGBT modules attaches great importance to online health management of IGBT modules in the lifetime and the enhancement of system reliability,which has become the hotspot of power electronics field.Based on the application requirements and major challenges,the paper explores and researches the method of aging and junction temperature online extraction:Firstly,the paper establishes the distributed parameter circuit model which takes aging process into account.Based on the model,the effects of bond wire aging on switch on transient process of IGBT modules are deeply analyzed via theory analysis,software Simulink and experiments.Besides,the paper comes up with several aging sensitive dynamic electrical paarameters,which lay foundation for aging information extraction.Secondly,the paper establishes math model for collector current rise period in switch on process,and testifies that(dic/dt)max is only related to junction temperature under some certain circumstances,based on which a driver integrated method is come up to extract jnction temperature without the need of a current sensor.It provides a new idea for the online application of IGBT module junction temperature extraction.Finally,the paper invents and designs a DC accelerated aging test platform for high power IGBT modules.It can make several modules under power cycling test independently at the same time,which lays foundation for the research of aging and junction temperature coupling effects on IGBT electrical parameters.
Keywords/Search Tags:High Power IGBT Modules, State-of-health, Aging Sensitive Electrical Parameters, Driver Intergration
PDF Full Text Request
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