Font Size: a A A

The Fabrication And Properties Of GaN/Ga2O3 Pn Junction Based Self-powered Ultraviolet Photodetectors

Posted on:2019-05-12Degree:MasterType:Thesis
Country:ChinaCandidate:H Z ShiFull Text:PDF
GTID:2348330542473630Subject:Nanomaterials and Devices
Abstract/Summary:PDF Full Text Request
With the development of the photoelectronic detecting technique,ultraviolet?UV?photodetectors?PDs?have huge applications in flame detection,ozone hole monitoring,ultraviolet communication and national defense pre-warning and tracking,etc.At present,the UV detectors on the market are mainly vacuum UV multiplier tubes and Si-based UV detectors.The vacuum UV multiplier tubes have the disadvantages of bulky,fragile and high power consumption.However,the Si-based UV detector requires an expensive filters to achieve the detection of ultraviolet light.The wide bandgap semiconductor materials with a greater bandgap than 3.0 eV are only sensitive to UV light and allows direct detection of UV light without the need for additional filters.GaN has a wide bandgap of 3.4 eV and is an ideal UV detector raw material.Currently,most GaN-based UV detectors are based on photoconductive metal-semiconductor-metal?MSM?structures.UV detectors based on this structure tend to have persistent photoconductivity and slow response time,and the structure requires external bias to work,which increases the power consumption of the device,limiting the application of the device.In contrast,self-powered UV detectors based on pn junctions or heterojunction structures show great advantages without bias applied.In this paper,a built-in electric field is formed through the formation of pn junction,and the photogenerated carriers are rapidly separated at the interface and transported to the corresponding electrodes,so that the detection of the ultraviolet signal can be realized without the need of external power supply.In this work,GaN with a bandgap of 3.4 eV is used as the p-type material and Ga2O3 with a bandgap of 4.9 eV as the n-type material?which also serves as a window layer material?,Ga2O3 thin films were grown on GaN thick films by pulsed laser deposition?PLD?,a self-powered UV detector with GaN/Ga2O3 pn junction was prepared,and a larger built-in electric field was obtained by doping Ga2O3 films with Sn which improved the performances.The main contents and achievements are as follows:1.GaN/Ga2O3 pn junction based self-powered ultraviolet photodetectors.Ga2O3 film was deposited on the p-GaN film to construct pn junction by pulse laser deposition?PLD?technology with 750?of the sapphire temperature and under vacuum situation(2.0×10-5Pa).The results of the crystallinity show that Ga2O3 film is grown along with the orientation of?-201?direction,and the thickness is about 375nm.The photoelectric properties exhibit a typical rectifying characteristic and self-powered characteristic,and the IV curve without passing zero,shows the photovoltaic characteristics,andexhibits self-powered characteristics under 254nm and 365nm light.It also exhibits higher Iphoto/Idark?152?,quicker responsetime?0.08s?,extremly higher responsivity?54.43mA/W?and high detectivity(1.23×1011cm·Hz1/2·W-1)under 365nm light with the light intensity of 1.7mW/cm2.2.GaN/Sn:Ga2O3 pn junction based self-powered ultraviolet photodetectors.Sn-doped Ga2O3 films can increase the Fermi level close to the conduction band and form a larger built-in electric field with the p-type GaN to increase the separation of photogenerated carriers.The PLD method was used to grow a Sn-doped Ga2O3 thin film?2%doping concentration?on a p-GaN thick film substrate at different oxygen pressures and different substrate temperatures to form a GaN/Sn:Ga2O3 pn junction.With the increase of the growth temperature and the decrease of the oxygen pressure,the crystallinity,surface flatness and photocurrent of the Sn:Ga2O3 thin film both increase.The samples prepared under vacuum(8.0×10-4Pa)and 750?exhibited the highest UV performance.The detectors based on GaN/Sn:Ga2O3 pn junctions had obvious photoelectric response only to light with wavelengths less than 385 nm.Under the condition of 254 nm illumination and 0 V bias,with the increase of light intensity from 50?W/cm2 to 1800?W/cm2,the photocurrent showed a linear increase,while the photoresponsiveness showed a downward trend with the maximum responsivity reaching 3.05A/W and reaching the highest detectivity(1.69×1013Jones).Under the light intensity of 500?W/cm2at 254nm,the heterojunction has a dark current of about 10-11A,a photocurrent level of about 10-6A,a Ilight/Idarkark ratio?105?,a faster response time?rise time of 23.6 ms,fall time of 31.5ms?.
Keywords/Search Tags:Ultraviolet detector, pulse laser deposition, GaN/Ga2O3 heterojunction, pn junction, photoelectric response
PDF Full Text Request
Related items