Design And Implementation Of MAC Layer Downlink Carrier Aggregation In LTE-Advanced Terminal Testing Instrument

The industrialization of LTE-A has greatly promoted the rapid development of the whole wireless communications industry in recent years.Both LTE-A terminals and terminal testing instruments are faced with the great opportunities of development.The research is derived from the project of LTE-A terminal testing instrument of a domestic communications technology company.The thesis has completed goals to design and implement the MAC layer downlink carrier aggregation in LTE-A terminal testing instrument through the process of studying the technique of carrier aggregation,analyzing the function of MAC layer in LTE-A system,designing the implementation scheme,coding,debugging and verification.Firstly,the technical background and significance of selection of the thesis are described.Then the thesis elaborates the functions,the hardware architecture,the software architecture and the demand and principles of designing the software of Layer 2 in LTE-A terminal testing instrument.Secondly,the thesis analyzes the needs,the scenarios of deployment and technical characteristics for carrier aggregation technology.The impact of carrier aggregation on the MAC layer and the RRC layer in LTE-A system is analyzed according to the the research direction.The category,functions and related operations of serving cell for carrier aggregation are discussed.Thirdly,the implementation scheme of MAC entities for carrier aggregation is designed based on the analysis of the functions in MAC layer downlink.The downlink scheduling,the logical channel processing,HARQ entity,downlink control information and the realization of the process to exchange data between MAC sub-entities are presented.And the thesis has respectively analyzed and discussed them.Then the implementation scheme is verified by using the 3GPP standard test cases,while analyzing the results of the verifications.Finally,the thesis summarizes the implementation procedures and describes the prospect of the direction of the development of the terminal testing instruments.