Research On Accelerated Life Test Method For LED Lamps

With the rapidly development of semiconductor light emitting diode technology,the light effect of LED light source is increasing,and its costs continue to decline,compared with the ordinary incandescent lamp and fluorescent lamp,it has high luminous efficiency,good energy saving and long life.So,the LED lamp has a widely uses in everyday life.Since the life characteristics of LED lamps is too long,the test time is also very long,so it is very important to study the accelerated life test method of LED lamps.In addition,because the LED generated a lot of heat in the working process which will lead to the increase of the chip junction temperature,and it will affect the performance and lifetime of the LED lamp seriously,so it is important to study the thermal performance of LED lamp radiating device.At present,using single stress accelerated life test is the common method of life test for the LED lamp.In order to reduce the test time,this paper designed two experimental parameter,which are the temperature and the humidity to accelerate life test.At the same time,the life evaluation method is used to calculate the life of the experimental data.Aim at the heat dissipation for heat radiation LED lamp device,in this paper we combined the method of FLOEFD simulation software and actual measurement,and we analyzed the impact of different cooling effect of cooling device and sample lamps of LED junction temperature.In this paper,the main contents including:(1)For the LED lamp life test,we designed a accelerated life test based on the temperature stress and humidity stress as the accelerated stress,and the flux attenuation for initial flux of 70% as the criterion of failure detection,so as to shorten the test time at lase.(2)The heat dissipation device of the sample is simulated and analyzed by usingFLOEFD thermal simulation software,and the data are compared with the test measurement data.(3)For the flux test data of LED lamps accelerated life,we used the Weibull distribution to describe the life distribution of the production,and used the least squares method,Allenness model and Peck model to analysis the date,the product life under normal stress was finally obtained.