| Electrical connectors are widely used in communication,electric power and other fields.,and,with the development of science and technology,electrical connectors have been made great progress and development.Therefore,the reliability of the connector is put forward higher requirements.The factors that affect the reliability of connectors are various,in essence,affect the use of connectors by affecting the contact performance of connectors..The contact stress between the contact surfaces is the key factor to determine the contact resistance.The temperature rise caused by the heat of the connector can also affect the reliability.,which leads to the reduction of the service life.So the structural and thermal analysis of connector are necessary.This thesis is mainly a research for reliability analysis of copper-PCB connection.Firstly,research thecopper-PCB connection.Secondly,analyze the influencing factors of copper-PCB connection contact performance.Thirdly,establish finite element analysis model of copper-PCB connection to analyze.the contact stress and temperature rise under load response,the optimization scheme combined with the experimental result.According to the research results,it is concluded that the effect of bolt torque,the number of bolts on the contact stress,and the effect of the current and contact resistance on the temperature rise.The distribution of distance between the contact stress and bolt hole center..The contact stress caused by the multi bolt connection in the same position is in accordance with the superposition principle.The effect of thermal stress caused by temperature rise on the contact stress is not obvious.The results of structural analysis and thermal analysis,provides the basis for the structure optimization of connecting copper-PCBconnection... |