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Research On The Digital Display Accuracy Of Planar And Thick Interferometer Based On C++ Program

Posted on:2016-12-15Degree:MasterType:Thesis
Country:ChinaCandidate:L ZhangFull Text:PDF
GTID:2308330503950098Subject:Computer technology
Abstract/Summary:PDF Full Text Request
Flatness is an important parameter in geometrical quantity measurement。The main technical index of the surface quality of the working surface and the surface quality of the surface of the machine and the machine is evaluated.According to the different quality of flatness requirement,The methods of assessment and the variety of measuring instruments used in the measurement。The flat crystal is used as the measuring instrument and the main standard for the measurement of the flatness,is mainly used for evaluation of high precision surface quality.In order to ensure accurate and reliable of optical flat measurement results,The plane of flat crystal must meet certain requirements.Now on to crystal flatness measurement,Our country mainly adopts ways such as plane interferometer by light measure thickness interference principle.Although the measurement principle of science and rigorous, high precision, the measurement used in the process of reading microscope on the interference fringes of microdrum line and through reading,whitch is the error of the measurement is relatively large and low efficiency. In order to overcome the limitations of the measurement method, This subject will be guided by theory and make practice of the measurement method of reading device digital transformation. High resolution CCD camera is used to capture the interference fringes, using digital image identification technology and computer processing software,and recognition and processing of the collected images by filtering, searching and thinning,and calculateing the flat crystal flatness.After verification of the measurement method,the evaluation of the uncertainty of the measurement results and the test results were analyzed.Not only can effectively reduce the measurement error,and the measurement efficiency will be significantly improved.In this paper, the following innovative results have been achieved according the transformation of plane and other thick interferometer.(1)Connect the CCD image sensor with the instrument in the production connection device,and the other end is connected with a computer through a data line,the computer program software is programmed to recognize and deal with the interference fringes.To overcome thedrawbacks of the original measurement process with a simple and feasible operation procedure,at the same time, optimization of the original measurement process with minimum cost.(2)Determine the degree of Flatness Based on computer program,whitch have reduced the repeatability error and improved the accuracy and reliability of measurement results.
Keywords/Search Tags:Plane degree, Image processing, Plane and other thick interference, Uncertainty analysis
PDF Full Text Request
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