Design And Realization Of Software For Testability Modeling And Life Prediction Based On Data Management

In the current DFT software, most of them do testability modeling are based on signal flow, considering with the complex circuit systems, users should develop a deep understanding of structure composition and signal flow of the system under test to import a large number of data and complete the testability model, this process costs a lot of time and energy. At the same time, using the current life prediction software which based on data-driven, users require to obtain and input a large number of historical data for different products, which reduce the efficiency of those software and the practical value of those data. In view of the above two problems, this paper designed and realized a testability modeling and life prediction software based on data management. Main contents in this thesis are as flows:Firstly, this thesis designed the architecture of the software. The software is divided into data management, testability modeling and index calculation, life prediction based on data management. Using VC++6.0 and Vim as the development platform,we designed the architecture of the software. In addition, we designed dependence-matrix data structures based on EXCEL files, which is the key data structure for the data transfer between modules.Next, the data management module has been realized. It is the basis of the other two functions. For the complex structure and variety types of electronic system, this paper reasonably design the relational structure of the database, unified manage the data which are used for testability modeling, index calculation and life prediction. In order to ensure the reliability and certainty of the data in database, this paper using electronic flow to update and maintain the database.Then, this paper uses a testability automatic modeling method based on data management, this method just need circuit schematic files as input to automatically created and output the testability model, meanwhile, users can view the testability model and the connection topology of devices in the circuit under test through the client software. Because of the way of modeling, the testability index calculation method also has difference, this paper introduces and realized the circuit level FDR, the device level FDR and the FDR under different test task in the testability model.After that, this paper makes full use of the database which has been built to designsthe life prediction module based on data management, this module provides the function of searching and importing the historical data for different life prediction based on data-driven. After that, this thesis implements a life prediction method based on nonlinear fusion accelerated degradation process and failure rate modeling, this method has been integrated into the module and combined with its function of query and import the degradation data to realize the service of life prediction. At last, the interactive display window of life prediction module has been designed and realized.Finally, the software has been tested and verified. An instance of circuit project named “TD41E1XF0SH_VA” is tested using our software, all the module functions above are tested in this instance.