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The Technology Of Static Analysis Of Array Object

Posted on:2015-05-16Degree:MasterType:Thesis
Country:ChinaCandidate:J WangFull Text:PDF
GTID:2298330467963044Subject:Computer Science and Technology
Abstract/Summary:PDF Full Text Request
Static testing is an import software testing method, there are many static testing tools, and these tools have false positives and false negatives when they test software. False positives will cause bad user experience, although we can manually eliminate these false positives. If some defects cannot be found, we may think that the software is reliable, once these errors are triggered when the software is running, they may cause software failure and other unpredictable results.According to the DTS testing reports, we find that array related defects are accounted for about30%, and the array related defect density is substantially0.3/kLOC. When DTS tests array object, it has many problems, for example, array memory model is incomplete, the calculation of array element is inaccurate and so on. To solve these problems, we propose a new array memory model, its name is symbolic array model, this model can solve these problems and it can also be combined with array related calculation. At last, static testing tools will have fewer false negatives and false positives.Analysis of static arrays can also be extended to other detects like buffer overflows, memory leaks, null pointer reference and so on. If we can effectively solve these problems, it will enhance the software quality. It has very important practical value.
Keywords/Search Tags:software test, defect, array object, memory model
PDF Full Text Request
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