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Research And Implementation For Analog Test Interchange Format

Posted on:2016-01-18Degree:MasterType:Thesis
Country:ChinaCandidate:H B ZhangFull Text:PDF
GTID:2298330467493489Subject:Information and Communication Engineering
Abstract/Summary:PDF Full Text Request
With the rapid development of electronic technology, the field of electronic products is expanding gradually, the electronic technology has penetrated into all aspects, just as aviation, health care, education, etc, but with the constant renewal of the circuit system, its structure is become more complicated, which brings circuit testing and maintenance greater difficulties. Just rely on human to repair the faulty equipment has been unable to meet the needs of society, especially the military, aerospace and other fields, equipment failure need to locate quickly and repair rapidly.At present the circuit fault diagnosis system is mainly divided into two parts of circuit simulation and post processing. Circuit simulation part mainly completes the circuit simulation, data results acquisition, knowledge processing, etc. Post processing part mainly completes the implementation of intelligent diagnosis and TPS test. For the simulation part and the post processing part, the information interaction is very important. Currently, the development of digital circuit is rapider, and the simulation system and test format is already quite mature. However, the analog circuits because of its input signal continuity, not exhaustive, the characteristics of fault model is complicated, so the development of fault diagnosis is relatively slow, and the simulation test interchange format (ATIF)has not been a standard until now.In order to improve the efficiency and the level of automatic test system for fault diagnosis of analog circuits, this topic research and define a exchange mechanism of analog simulation,and provide information and data formats for the data transfer and the development of test program, which based on simulation. In view of the present research project,this article has designed interface for the analog fault diagnosis system of circuit, studied on the communication relationship among simulation, post processing and ATIF data, designed store content of ATIF file and the relationship among the files, realized unified management and scheduling of the interactive data. The analog circuit fault is complex and changeable, in order to guarantee the effectiveness and overall of the ATIF data, this article adopts multi incentive injection through the SPICE engine and analysis circuit by Monte Carlo simulation, use wavelet analysis extract the feature of the simulation data, and use artificial intelligence algorithm just as BPN,SVM,AIS to generate knowledge and evaluate them. Finally, according to the ATIF interchange format generate ATIF data and use it to diagnosis a analog circuit example, the experimental results demonstrate the effectiveness of the analog test interchange format.
Keywords/Search Tags:analog test interchange format, simulation data, post processing, fault detection
PDF Full Text Request
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