Research Of Testing Scheme Generation Based On HFSM Model

As a major means to ensure the quality of equipment, testing work is veryimportant, but it is not an easy job. How to quickly generate test scheme of highquality, and ensure this scheme covers all states of the equipment, is a research focusin the system testing field and is also a problem plagued the system tester. At present,the tester is mainly using artificial way to design test plan, which led directly to alarge overhead in the system testing phase, which also increases the system total costof development. In addition, quality of the testing scheme depends on the quality ofdesigners, so the quality and reliability of equipment are not guaranteed. Therefore, anautomatic method to generate high-grade testing scheme is most urgent need.In view of the above problems, I study the testing scheme generation methodbased on hierarchical finite state machine model and the application of set coveringproblem in reduction the system testing scheme generated by finite state machinemodel. I dispose effectively the state space explosion and reduction problem in testingscheme by applying the both research to the testing scheme generation system.In this paper, firstly, it introduces the whole structure of testing schemegeneration system based on hierarchical finite state machine model, the function andrelation of each module are introduced, and the testing scheme generation methodbased on the finite state machine model; secondly, it introduces the structure of testingscheme generation module and testing scheme reduction method based on setcovering which used in Wp-method and UIO-method at length, it also introduces theimplementation method and process design; finally, it discusses the effect of reductionmethod based on set covering problem.