Fault Diagnosis For Snapshot Device Through Identifying Image Abnormal Features

The method of fault diagnosis based on image processing is the important technical approach when it supports lossless, non-stop and intelligent and efficient diagnosis.Snapshot device is widely used in intelligent transportation, which works in a more special way than others and then many faults appear. Currently, the faults are mainly diagnosed using artifical diagnostic method, which is unscientific and of low efficiency and needs to be changed urgently. The method proposed in this paper can realize that computer diagnose snapshot device automatically and intelligently.Through analysing the current situation and the problems of the current fault diagnosis,the fault diagnosis for snapshot device is introduced preliminary and systematic in this paper, The abnormal features of capture images is studied by digital image processing technology, the relationship between the type of fault and the type of abnormal feature is established,The main work of this paper are as follows:First, difference and similarity between snapshot device and others devices are analysed comparatively. The application of image processing technology in fault diagnosis is described detailedly. the license plate location is important to the fault diagnosis of snapshot device.Second, principle of fault about camera, ring induction coil and dedicated flash in snapshot device are discussed. Abnormal features within the images captured in snapshot device are defined, classified and summarized. The relationships between the faults and abnormal features are established, which is the basis of the proposed method in this paper.Third, a method of how to locate license plate is investigated based on binary images processing. The best binary image is generated by multi-threshold processing, the license plate location is proceed by the grayscale jump and the adjustment about the width and the space of the character projection.Fourth, the identification method based on the combination of the characteristics of the capture image abnormal characteristics is proposed. Color, behaviour and other abnormal features are identified through analyzing color component distribution, mean grayscale value,region.According to mapping relationships between the type of fault and the type of abnormal feature, achieve the classification of equipment fault diagnosis.Finally, a fault diagnosis system for snapshot device is developed based on identifying abnormal image features. To diagnose the faults of snapshot device more intelligently and automatically, adaptivity of the algorithm is also studied. At the same time, the visualization of fault information is achieved...