The Algorithm Research Of Test Generation Of Integrated Circuits

Integrated circuits is a circuit module which collect a variety of electronic components inthe semiconductor circuit board to achieve a particular function. It is the part which plays amajor role in the circuit equipment, and the capability is computing and storage. Integratedcircuits are widely used in various military and civilian electronic devices such as digitalhome appliances, telecommunications, computers, communication, measurement, sensing,control, and many other areas of coincidence of playing the role of main force is the corestrength of many industries..With the rapid development of microelectronics technology, more and more tolarge-scale integrated circuits, the test more and more time, more and more difficult, costs areincreasing. However, world-renowned big companies know that product quality is the life, isthe brand’s core strength, Electronics, of course, understood this, so the integrated circuit testgeneration method is advanced, reliable, fast, plays a decisive role in the electronic fieldposition. Designers want to know the correctness of the design of products, producers want toknow the passing rate of manufactured products, the user wants to know whether to buy thegoods meet the required functionality. Thus, the research of the algorithm of the integratedcircuit test generation algorithm is very necessary.This paper first describes the background of integrated circuit test generation andsignificance of the basic concepts of integrated circuit test generation, the basic method, basicprinciples, domestic and foreign research and development status; then elaborated on particleswarm optimization, ant colony algorithm, genetic algorithm three algorithms in theapplication of integrated circuit test generation, the basic idea that the three algorithms, thebasic concepts, parameters, formulas, functions, graphics, implementation steps; last threealgorithms obtained by simulation results of test generation, including the fault coverage andresponse time, then the simulation results of the data to draw conclusions.Finally, the system simulation of these three methods of test generation algorithms toverify experimental evidence, these three algorithms for integrated circuit test all achievedgood results, but based on particle swarm sequential circuit automatic test generation,small-scale circuits available in a very high fault coverage, test generation very fast; antcolony algorithm for large-scale circuits in the good results achieved, and the speed of testgeneration can be.