Test And Analysis Of A FPGA-based PCM Hybrid Storage System

Since the advent of the world’s first computer, the computer’s storage devices are constantly updated. Nowadays, the demand for high-performance and high-capacity storage is imminent, especially in this cloud storage era today. The storage system that still regards traditional disk as the main medium has been unable to meet the increasing demand for storage. In this case, the scientific community has begun to study a new kind of storage, from disk, CD-ROM to new nano technology devices, regardless of size or performance of the chip, all reflecting the ever-changing of technology. In recent years, the scientific community has discovered a new type of phase change storage, for its unique and superior storage performance, which may be able to replace the memory and hard drive in the future. PCM is such a new storage medium, having non-volatile, low-power, anti-vibration characteristics. Like other storage, PCM chip is also not perfect, and it has limitations for its writing number and thermal crosstalk between adjacent bits. In this case, we propose a new storage system architecture based on PCM chip and the DRAM chip---"unified memory and external memory" system, and ultimately in863project "based on the novel non-volatile memory’unified memory and external memory’ system structure and key technology". The solution combines the traditional internal with external memory together, solves the mismatching problems of external and internal memory, traditional storage hierarchy and processor performance, and fundamentally changes the existing storage systems. To enable the smooth implementation and timely completion of the project, we need to actual test the various performance parameters of PCM chip, which is not only conducive to the development of the design, but also provides basic data for the implementation of the final program. Therefore, we design and manufacture the analysis tool to test the PCM hybrid storage system based on FPGA, actually measuring the basic data of PCM chip.Firstly, based on the full understanding of PCM chip, DRAM chip characteristics, and "unified memory and external memory" system, this paper analyzes the functional and non-functional requirements of FPGA-based hybrid storage of PCM system testing analysis tools, identified the main features of the system and the problems to be solved, that is how to test the PCM’s property by using this analysis tool.Secondly, based on the demand analysis of FPGA-based hybrid storage of PCM system testing analysis tools, this paper explores from two aspects of functional architecture design and technical architecture design. The former is mainly discussed from reading, writing and other modules. The latter is mainly discussed from the main state machine, FPGA development and Verilog HDL application architecture. After completing the main design structure of the system, this paper continues a detailed design of the system. In view of the different module structure of PCM chip, we still adopt different modules to expand the narrative strategies, and design the details of system according to the timing diagrams and flowcharts.Thirdly, based on the full understanding of testing analysis tools for detail design, this paper tests and implements the basic operation and performance parameters of PCM chips, ranging from the design and manufacture of analysis tool, setting up the test environment and summarizing the test results related to the PCM chip, etc.. The paper summarizes according to the above and analyzes the existing problems in the system and makes a prospect for the future work.Therefore, the implementation of the test system are not only conducive to further our understanding of PCM chips, but also provide first-hand information for the successful implementation of our projects.