Estimation Of Low-frequency Noise In Zener Diode And Design Of Measurement System

As a basic element in the control system and electronic field,semiconductor plays amore and more important role with the rapid development of national defense,nuclearpower,satellite communication,aerospace and medical instrments,we put forwardhigher request in quality and reliability.How to detect the quality and reliability ofsemiconductor rapidly and accurately become the main problems at present stage.Onthe basis of Noise spectrum analysis which is widely used,we find a new method toestimate the low-frequency noise parameters in the zener diode to compensate thepresent insufficient existing,and combined with virtual instrument technology,build alow-frequency noise data acquisition system to analysis the low-frequency noise.The main reserch content is as follows:(1) Clear the relationship between zener diode and the reliability of the lowfrequency noise,and clarify the noise characteristic of the semiconductorgenerated by the quality defects.(2) Building low-frequency noise test system,and research the system analysis：time-domain analysis and frequency-domain analysis.(3) In the time-domain,we use the method of wavelet transform to get thelow-frequency noise parameters of diode noise,and use the modified Hurstexponent to estimate the parameters of1/f noise.(4) In the frequency-domain,we estimate the power spectrum using ARparameter model and fourier transform, then estimate the noise parameters.(5) Estimate the bispectrum using high-order cumulants method and thenestimat1/f noise parameters.