Design And Implementation Of A High-speed Tester Clock Pull Side

The enterprise network switches need a series of tests before release. However, the clock stress test is one of the most important test to make sure of the circuit boards’s security and robustness. This project is set up for the clock stress test by Hangzhou H3C Technologies Co., Ltd. It’s aimed at making it convenient to do the clock frequency offset, clock phase offset test for the developers.The High-speed Clock Generation Instrument, short for HCGI, can generate any frequency clock signal from10KHz to600MHz. It also supports functions such as clock frequency offset, clock phase offset and trigger delay. Inputs and Outputs drivers are capable of accepting LVTTL, LVCMOS, LVPECL, LVDS, CML signals.First, this paper does the research on the high speed circuit and the signal integrity and gives the general design scheme of the HCGI on foundation of high speed circuit design. Secondly, this paper discusses the hardware design. It consists of three parts, Power Unit, MCU Unit and AD9558Unit. It also gives the PCB’s placement, routing and simulation. After that, the software design takes the modular design, has deep research with the AD9558’s cooperation. Finally, the author debugs and verifies the HCGI, and takes a discussion about some project technical problems.Research and debugging result shows that the HCGI system can realize many functions such as frequency offset, clock phase offset and so on. It achieves the desired objectives. It is ready for use and will make efficient to improve the product quality for the company.