Development Of Intrinsic Efficiency And Residual Error Parameters Measurement Using Large Reflector

In recent decades, microwave theory and techniques have been widely used in communications, navigation, scientific research, energy and many other fields, it has been a major achievement of modern science and technologies. Microwave measurement technique is a special technique which is carried out to determine value and maintain the unity, it is an essential component of the microwave science. During the specific microwave measurement work, adequately and reasonable making use of the test conditions on hand to complete the test task, and ensuring the accuracy of the measurement results, are still worthy of further exploration. So research on the measurement method still has important theoretical significance and practical value. In this paper, making use of large reflector device to measure effective efficiency of two-port devices and making use of large reflector device to measure network analyzer calibrated residual error term techniques are studied. The main research work is as follows:1. two single-port measurement techniques based on large reflector device and classic de-embedding technique are analyzed in detail, and the three measurement methods are implemented on the waveguide test system, the effective efficiency of a two-port, small attenuation device has been measured, error sources of the measurement results were analyzed.2. A large reflector technique on computing the error terms remaining of calibrated vector network analyzer is introduced, the theoretical model of technology and the data processing method are analyzed in detail; parameters requirement of air lines and large reflector terminals are in-depth research; linear data processing extensions, windows factor correction and interception methods are analyzed in detail. Finally the LabVIEW software is employed in data processing and secondary correction to the measurement results.3details of the development from the transmission line theory to the new waveguide circuit theory, the impedance mismatch measurement system is analyzed making use of new waveguide circuit theory, the realization of impedance mismatch correction is carried out; LabVIEW software is prepared for impedance mismatch correction. Finally, the on-chip open in the piece scattering parameter measurement system are characterized and this technique can be applied to the on-chip scattering parameter measurement system and the impedance mismatch correction can be completed making use of the impedance mismatch correction software.