Quartz Detecting System Based On LabVIEW

Nowadays with the rapid development of productive forces and the great improvement of productive efficiency, an increasing number of automated instruments based on machine vision and image processing has been replacing simple and mechanical manual operation. At present vast majority of quartz wafer detection relies on manual visual inspection in which inevitably many shortcomings are existed. This article describes a quartz wafer detection system based on LabVIEW. The success of research and development on this system will change the industry of quartz wafer and will have a broad market prospects.Firstly, the article reviews the domestic and international current situation of quartz wafer detection, detecting technology of cosmetic defect and the application of PLC and LabVIEW. Then started from researching goal, the overall design and difficulties of the system are put forward. There are four essential modules in the system; they are software module, image processing module, electrical module and mechanical module. Loading, fetch, detection and classification are four subsystems in lower computer. It describes the selection and construction of hardware, draws overall effect picture and demonstrates the schemes of flow diagram. Upper computer programmed by LabVIEW describes communicating module which includes external hardware trigger of USB digital camera, image acquisition and processing module. Imge processing module including positioning and detecting plays the most important part in this system. Through analysis and comparison of test results, preliminary achievement of this system is demonstrated. In the end, inadequacies of the system are summarized and improvement ideas are proposed.