Research On The Algorithm Of IC Test Vector Translation

With the rapid development of IC test technology, the software and the ATE are improved greatly. Test data which are used as test stimulus, often need to be cyclizing. To drive a tester, data must be provided in uniform, consistent, repeatable collections. These collections are termed "cycles". The process of constructing these collections, generally from simulation environment, is called "cyclizing". The discordant between software and ATE is the main reason of the problem. The difficulty in solving the problem we must face with is how to improve the speed and the efficiency.Firstly, the cause of this problem was explored. The latest NEWS was introduced. The basic concept in IC test industry was presented. All above supplied foundation for the next analysis.Secondly, much software and ATE is used in IC test industry, and various file formats are produced, such as WGL, VCD and STIL. With analyzing these file formats and comparing the difference, the cyclizing was achieved in general.Thirdly, according to the research of cyclizing, the algorithm was proposed with storing data in chain table, describing time in raising digits. The translation was realized by the common greedy algorithm and the algorithm above.At last, with the help of the Code::Blocks, and depending on the study of GTKwave, the function of cyclizing was mainly accomplished. Given the lack of reference material, there was a lot of room for improvement in the practical translation.