Aoi Electronic Parts Recognition Algorithm Based On Sift The Research And Implementation

AOI automated optical inspection system is a computer vision based automatic quality control system. Since AOI automatic optical inspection systems has strong capable of detecting different defects in electronic assembly and manufacturing, it has wide applications in varieties of electronic manufacturing field. However, the existed AOI product on the current market is inefficient and low environment adaptability in its recognition algorithm part. This is mainly expressed in its algorithm is high dependence on the accuracy of the photo, it usually need a high precision CCD imaging system to get better recognition results, and if the picture exist issues such as illumination or small angle rotation, the recognition algorithm will get a poor recognition result, and prone to false positives.SIFT scale-invariant feature transform is a local feature descriptor extraction algorithm proposed by David LOWE in2004. After study on the current AOI products and its recognition algorithm and based on the existed electronic component recognition algorithm, this paper propose a SIFT based AOI electronic component recognition algorithm. Through the relevant recognition experiment, the algorithm is proved having strong adaptability in scale invariant, illumination and rotation invariant environments, as well as more efficient in AOI’s electronic component recognition.