Test Implementation Of Embedded Sram Built-in Self Test

Firstly,this paper introduce the back groud and significance for memory tetsing.Secondly, we introduce memory circuit, bit cell, and workprinciple. These are the foundation of studing memory design and testing, then we discuss memory fault model and testing arithmetic.we study three different testing methods:ATE access address directly;embeded CPU testing SRAM;MBIST test SRAM. Comparare three testing methods and find that MBIST is the low cost and high efficiency testing method.We study the theory and architecture of MBIST, LFSR foundation, design tool and flow.Finally, the important topic of this paper is that MBIST testing implement. We introduce DUT(device under test), ATE resource and configeration, testing pattern genaration, and testing program development. We had to develop GPIB communication to connect other’s instruments. We develop JAVA and VBA tool to collecting test raw data and form test report.