The Transient Signal Storage Test System Research And Development

Along the projectile base pressure in the artillery bore bottom pressure test is important to the design, manufacturing, product quality and production of the artillery and the projectile. This article design a transient signal storage test system based on the artillery bore bottom pressure test environment, according to the theory of electrical measurement technology and design theory of storage test system.According to the research for projectile base pressure test, this article select programmable logic device CPLD as the main chip to operation the peripheral chips. The CPLD Use the FIFO data caching technology high-speedly storage A/D converter and ultimately adopted the CPLD built-in the UFM as a data storage medium storing the data in FIFO buffer. Through the the CPLD years and string conversion module after the end of the experiment, the UFM data sent through the serial port to the PC software. In order to recover the experimental data we design a simple PC software.by Visual Basic. The main function of the host computer is recycling CPLD internal UFM experimental data, processing experimental data and drawing the graphics of shock wave pressure.In this paper, the overall design is proposed of the system based on the signal characteristics of projectile base pressure. The digital circuit section and the CPLD programmable logic device Describes the design of the system hardware circuitry and logic timing from the portion of the analog circuit. Analog circuit section includes sensor selection, design of the charge amplifier and signal conditioning modules; Digital circuit parts including A/D converter, FIFO cache and serial communication module; CPLD programmable logic device module includes a built-in of the UFM design, the A/D conversion state machine design, the FIFO design of the cache read and write, the storage trigger design module. PC software includes three modules, data reception, data processing, and graphics rendering. Finally, we have the entire test system debug experiment,can complete the design requirements.