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Analysis Of Electron Beam Dynamics In Streak Camera Considering Space Charge Effects

Posted on:2013-04-03Degree:MasterType:Thesis
Country:ChinaCandidate:C WuFull Text:PDF
GTID:2232330407461537Subject:Traffic Information Engineering & Control
Abstract/Summary:PDF Full Text Request
The streak camera is a high sensitivity, high spatial and temporal resolution of rapid diagnostic equipment, it is a measurement of picosecond-level of optical devices within a very short period of time, it is widely used in the field of plasma physics、particle physics and the discharge phenomenon.In order to achieve a higher temporal resolution, the first optical signals are converted to electron density distribution, to scanning electric field which will be converted to the propagation direction of Electron density distribution of spatial distribution in the vertical direction, and according to the CCD which can readout signal acquisition and analysis system in real time. However, the determination of the boundaries of the streak camera is in the scope of picosecond, which may be strongly influenced by the electron beam space charge effects, resulting in signal skew, so it is very important to grasp the phenomenon through the correct numerical simulation.In such background, In order to grasp the space charge effect on the streak camera quantitatively. We have developed and combined electric field analysis with the analysis of the trajectory of a charged particle to numerical analysis codes to simulate the electron beam movements. In this code, the analysis of charged particle trajectory is to use LongGe Coulthard method to solve the charged particles movement equation, the analysis of the electric field is to use finite difference method to solve the Poisson equation, Charge density distribution is based on Particle-in-cell (PIC) principle through the distribution of electron beam. When considering streak camera’s own problems, the distribution of electron beam presents to be linear when optical signal gets through slits. As a consequence, the accuracy surrounding electron beam deteriorates and the space charge effect problems can not be evaluated properly. In the respect, considering the electric field calculation, the research and to use the boundary element method (BEM method) are discussed at the same time, we develop the code of BEM and confirm the safety of the code.
Keywords/Search Tags:Streak Camera, Space Charge Effect, Method Of Finite Difference, PICMethod, Boundary Element Method
PDF Full Text Request
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