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The Automatic Generation System Design Of The Motherboard FCT Test Plan

Posted on:2012-11-06Degree:MasterType:Thesis
Country:ChinaCandidate:J LuFull Text:PDF
GTID:2218330368491983Subject:Electronics and Communications Engineering
Abstract/Summary:PDF Full Text Request
Now the quality of the products is more and more concerned by people. So the product testing in the factory is also taken seriously more and more. Of course the computer motherboard test is also no exception. This is the last quality test of the motherboard for the customers. Because of more and more kinds of motherboards, developers must develop more test plans for those motherboards. Then developers have less development time, and work strength is also increasing. So there are more and more testing holes. And they affect product's quality. To solve the problem, we will develop the automatic generation system of the motherboard test plan. The motherboard testing in the factory is under WINDOWS 7 now, so this design will be developed by Visual C++ 6.0 under WINDOWS 7. After check the test plans of all motherboards, we find that there have many same function tests at the different motherboards. So we can use those similarities to develop a system to generate test plan. First, this system will get the hardware information of a motherboard from BIOS,PCI BUS,Super IO and manual input. Second, this system will design the test plan with motherboard's hardware information, modular test program, modular standard operation procedure, modular equipment list and modular test coverage. Last, the system will output test program, standard operation procedure, equipment list and test coverage of this motherboard. With this system, the test developers will have no test hole and have less development time, when develop motherboard's test plan.
Keywords/Search Tags:motherboard test, test plan, automatic generation system
PDF Full Text Request
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