Electronic Scattering As Enhance The Resolution Of Research On Low Light

Image intensifier is the core device in the field of low-light level (LLL) night vision technology. The important problems, such as sensitivity, resolution and SNR which are the key technical marks to the case of upgrading the product with unremitting efforts of people in a long time, directly restrict the effective range and image quality of the effective low-light-level night-vision equipment. The purposes of this research are consummating the theoretical model of GaAs photocathode image resolution enhancement technology, analyzing the related factors, explore the techniques, process theory and test methods for achieving high-resolution. The result of this research can provide theoretical guidance and technical support for the IV generation of image intensifier.First of all, the paper gives summary and analysis the theoretical knowledge of the resolution, electron scattering and electro-optical calculation. The paper modify the image intensifier computing systems to be revolving and symmetric structure using single channel expanding computing model, calculate the electrostatic field distribution of the image intensifier using finite difference method, calculate equipotential distribution using tracing method, calculate electron trajectory using Runge-Kutta method. The contents of electronic scattering and technology of MCP hatch-expanding are used in the computing model. With the guidance of theories, the paper uses Matlab software to program and simulation calculating. The results of the data and graphics are used to analyze how to improve the resolution of the image intensifier.Through the research mentioned, the paper proposes that the scattering electron can diffuse the dispersing speckle of MCP. The paper also proposes and the conclusion which is electronic scattering can reduce the photocathode sensitivity of the image intensifier. Comparing and analyzing the data and graphics which are calculated and simulated by Matlab software. The technical parameters and processes are given in this paper to achieve higher resolution.