Intelligent Testing Methods Of Embedded Systems Research

After having entered the post-PC epoch, the computer skill has penetrated into every area, embedded system is going to become the mainstream of the application of the computer, appears in every area of the social productive activity, and influences more and more on human beings. The quality and reliability of embedded system may straight influence every day life and production of the people. At present, there are more and more theoratical researches concerning the quality and reliability of the embedded system software. However, because of the peculiarity of software, and embedded system in particular, the applicable theories and skilles of the project now are not sophisticated enough. As the approach to increasing the quality and reliability of software, the software testing is of the great practical significance on both the software project and the practice, and becomes the focus of the research currently.This thesis focuses mainly on the embedded system testing automation and embedded system reliability testing and assessment. The thesis focuses on the way in which the establishment of test platform intergrating all the testing methods can increase the testing efficiency, and realize the ration assessment of the reliability of software.The main content of the thesis includes two parts. Part I includes chapter 1, 2 and 3. Chapter 1 introduces the background, the method in which the quality and reliability of embedded system can be improved from the angle of software project, and then states the role the current software testing plays in increasing the quality and reliability. Chapter 2 focuses on the fundamental concepts and principles of software testing, and the method of universal software reliability testing and of reliability assessment.Chapter 3 describes the concepts, characteristics and exploitative characteristics of embedded system, and stresses on the status quos, important research orientation, the content of research, the reliability testing and the characteristic of reliability assessment of embedded system, etc.