Infrared Adapter Circuit Fault Diagnosis System Developed By Research, And Image Matching

With the high-speed development of the modern military and civil electronic equipment, requests of the diagnosis technology of the failure circuit board have been enhanced correspondingly. The infrared failure circuit detection system can carry on the examination of the failure electronic equipment with the aid of the high performance thermal imaging device and the digital image processing technology. In order to meet the majority of diagnosis requests of the military and civil electronic equipment, the development of the adapter has been very important in the infrared failure circuit detection system. During the infrared failure circuit detection system is diagnosing the electronic equipment, because the time and the place are different between the infrared thermal imaging device is diagnosing the standard electric circuit board and the infrared thermal imaging device is diagnosing the failure electric circuit board, the position of their infrared thermal image will take place the relative changing (for example translation or revolves). Because the relative changing will result in the reducing of the accuracy of the determining the failure circuit region and the validity of the entire test system diagnosis result, their infrared thermal image must be matched. It is key to have a technique of the image matching that is better,quicker and more accurately to enhance the diagnosis precision of the infrared failure circuit detection system. Moreover, with the wide application of the ADC, the test of the ADC dynamic parameters has been very important. So, it will be very important on the practical value and the economic value to develop a kind of portable test device of ADC dynamic parameter that can carry on the test work and can be separated from the PC machine independently.This main purpose of this thesis is to develop the adapter of the infrared failure circuit detection system,the research of the image matching of the infrared failure circuit detection system and the testing ADC dynamic parameter based on the DSP system .The main contents and contributions include:1) The link technique of the analog switch-matrix MT8808 is proposed. Five groups of 8×8 matrices are developed by the matrix MT8808.They can meet the switching request of the massive input and output signals in the adapter, and avoid with the results that the wire to be complex and the component number to be oversize because the switching matrix is...