Measurement Management Information System Based On Design Pattern And Construction

This paper analyses the complexity of metrological work and increasing operation requirement, describes the network resources of metrological apartment. Metrological management information system based on design pattern is fully researched and many problems are solved such as the difficulties to reuse the code and recombine the system.Firstly, developing flow, several kinds of developing methods, computing mode, modeling language and supporting technique such as assembly technique are studied and compared. Then on the basis of this, the paper gives the developing strategy based on B/S mode. As the most classical designing methods, design pattern is laid stress on. It lays the foundations of management information system with expandable and reusable character.The paper focuses on the detailed research of data layer, middle layer and interface layer's design with application of design pattern. After designing, not only this management information system is expandable and also other system can reuse the general component. Then implementation of this system is discussed.Finally, we give the summary of this paper.