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The Theoretical Analysis Of The Awg Device Performance And Process Error

Posted on:2004-12-02Degree:MasterType:Thesis
Country:ChinaCandidate:L WanFull Text:PDF
GTID:2208360092970580Subject:Microelectronics and Solid State Electronics
Abstract/Summary:
With Internet's tremendous booming,optical communication network based on DWDM (Dense Wavelength Division Multiplexing) becomes a very interesting research objective. DWDM system can be utilized in construction of long-haul transmission network as well as short distance transmission network such as MAN (Metropolitan Area Network). In DWDM system,AWG is the most promising wavelength multi/demultiplexer,and what influence the performance of AWG most is the structure design and device processing.AWG's performances are crosstalk,insertion loss,temperature shift and PDL (Polarization Dependence Loss). To obtain practicable device,we must account for the influence from random processing error to performance besides structure parameters optimization. So we can both improve performance and cut down the cost. However,research related to the contents above is very limited so far. The purpose of the thesis is to design parameters associating with processing to provide theoretic foundation for developing practicable wavelength multi/demultiplexer.The author researches deeply the relation between the performance of the SOI-based AWG and processing errors. The results provide excellent guidelines in choosing design parameters and processing resolution.The mathematic model has simple computation and definite physical concepts so as to be easily understood. The computation model is appropriate for all kinds of materials besides SOI,and it is plausible to apply it into various wavelength multi/demultiplexers.
Keywords/Search Tags:Theoretical
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