Small Sample Test Of Electronic Equipment Research

In the test of electronic equipments, the traditional methods are based on the large sample size. It inevitably results in a relatively longer test period and a greater expense. It can also bring much more difficulties to the command, organizing, operation and cooperation in a test. And the unconquerable handicaps in traditional methods made them more and more unfit the test of electronic equipments.The application of the Bayesian theory in the test of electronic equipments has been studied in this thesis. The results obtained with the Bayesian theory were also compared with that with the classic probability and statistical decision theory. Through this research we deduce that the Bayesian theory can improve and optimize the traditional means that is used to a test in the past. The main work is as follows:The Bayesian parameter estimation and the hypothesis test of the unknown parameters of normal distribution and binary distribution were analyzed;After the presentation of the theories of the Sequential Posterior Odd Test (SPOT) method and the interceptive SPOT method, the use of them with the unknown parameters of normal distribution and binary distribution was analyzed thoroughly.Taking example for the detection range and detection probability of radar, the acquisition and transformation of history data were detailed; Then give the results of Bayesian parameter estimation and the hypothesis test of the unknown parameters; Then the sample sizes which need in the hypothesis tests of the radar detection range and detection probability were calculated by the interceptive SPOT method, and the hypothesis tests were verified with the approach of SPOT. After compared with the result of the traditional method, it can be sure that the Bayesian theory will be suitable to be applied in the test of electronic equipments.Lastly, all work in this thesis is summed up, and some problems that need to be further deliberated are listed.