Ic Test Probe Size And Surface Defects Image Measurement Method And System

The paper take IC probe as research object, with the study of related knowledge, design the online inspection system of tiny parts based on machine vision, which including image acquisition, image processing, image segmentation, edge detection, sub-pixel location, image character recognition and classify, and dimension measurement based on image.On the basis of analysis and comparing related image edge detection and sub-pixel location, here it presents dimensionality reduction gray-scale moment method and improved least-squares method. The experiments indicate that the method presented in the paper calculates faster and gets higher precision. To the IC probe between 0.3 and 0.6mm in diameter, the absolute error size detection are less than 3.5 um, the corresponding defect detection of pixel level up to 90%, and sub-pixel level up to 96%.On the basis of Visual C++,The paper compile the related program, including image acquisition and process, edge detection , sup-pixel location, image recognition and classify, which compose the software system of the online inspection system of dimension measurement and surface defect inspection of tiny parts. Apply the inspection system to a IC probe factory for the experiment inspection, statistics show that the precision of the size detect less than 2.5%, the detection rate of Probe surface defects higher than 98%, the result shows that the machine vision inspection system for IC probe dimension measurement and surface defect inspection is doable. The machine vision inspection system can apply to the IC probe surface defect inspection,stability and precision both can meet the need of the factory.