The Vector Tools In The Test System Design

A new approach is put up in this paper, that is to control all kinds of instruments using pattern instead of driver programming, due to that the present automatic test equipment system hardly satisfy the requirement of semiconductor testing. The original pattern tool is re-designed and re-implemented according to this new approach. Firstly the general architecture and logic of pattern tool is analyzed and designed by using object-oriented analysis and object-oriented design methodology, then the detailed work is done by using component-based software technology, such as component model definition and description, then a new pattern tool with its main functionality is implemented out in details. At last, a critical obstacle during the design of pattern data manager module is described, and a solution that is to vertically slice pattern data manager components based on instruments is designed and brought out in this paper. After improvement, the result shows that the pattern tool is able to control all kinds of instruments. It extends the instrument control compared to driver code programming, and lifts automatic test system out of difficulties in an efficient manner, and also the extensibility and maintainability is largely improved for itself.